yieldWerx’s semiconductor yield monitoring software offers a real-time, comprehensive overview of the entire manufacturing supply chain. This makes it easy for clients to classify, examine, and act on yield or quality-related problems in test and manufacturing processes. With yieldWerx, clients can easily identify and analyze yield loss issues to enhance product quality and increase yield. The company’s software also helps in identifying critical-to-quality (CTQ) parameters for each test or process step.
Some of the key features of yieldWerx’s semiconductor test data analytics solutions include Statistical Process Control (SPC), Part Average Testing (PAT), and wafer mapping. These features help clients perform yield analysis to detect and rectify defects in the manufacturing process. yieldWerx’s software is designed to handle all sorts of test data and is highly configurable, making it a valuable tool for a variety of semiconductor manufacturing applications.
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